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Question

Which component of XRD calculates d from θ and λ?

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Explanation

Interplanar spacing calculation from diffraction geometry is performed directly via Bragg's law, nλ = 2d sinθ, rearranged to d = nλ / 2 sinθ. Experimental diffraction pattern supplies θ values for each reflection, X-ray wavelength λ is known from source calibration, enabling lattice parameter determination. Fourier transform later uses d and associated intensities to compute electron density, interference law generalizes wave superposition, and Planck relation E = hν links photon energy to frequency without giving spatial distances. Bragg's formulation therefore remains indispensable component for indexing reflections and solving crystal structures of biological macromolecules.